- Compendex
- Engineering Index covers the engineering literature, with citations and abstracts from over 4500 journals, conference proceedings, technical reports, and books.
- Inspec
- This database is used to find citations and abstracts for research level articles on computing topics.
- IEEE Xplore (IEEE Electronic Library)
- Citations and abstracts to IEEE and IEE journals, conference proceedings, and IEEE Standards. Yale's subscription includes full text access to papers in IEEE journals and conference proceedings from 1998 to present.
The use of these electronic tools will not provide comprehensive coverage. The most recent information appears with the stated delay after publication of the actual articles and/or books. Please consult the list of covered journals, books, conference proceedings, etc. in order to become aware of the scope of this product. Please feel free to contact a librarian for further clarification or for identification of other information sources outside the scope of this resource.
Also consider the following indexes for related data:
HINT: Contact the librarians to determine other appropriate sources.
|
|